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CryoSIM/FIB-SEM

Correlative Optical Super-Resolution and 3D Electron Microscopy

Combine the molecular specificity and enhanced resolution of 3D structured illumination microscopy (SIM) with the nanoscale context provided by focused ion beam scanning electron microscopy (FIB-SEM) to unlock structure-function relationships throughout an entire cell volume.  

Or, take advantage of the FIB-SEM as a stand-alone technology.  Specifically engineered by Janelia's researchers to obtain 3D images at a combined volume size, spatial resolution, and imaging speed unattainable by commercial electron microscopes. Its ability to image whole cell ultrastructure at nanometer resolution is unparalleled in any other EM technique.

See detailed technical FIB-SEM specifications here.

See detailed technical CryoSIM specifications here.