FIB-SEM/CryoSIM

Whole-Cell Electron Microscopy with Correlative Optical Super-Resolution

Combine the nanoscale ultrastructure provided by focused ion beam scanning electron microscopy (FIB-SEM) with the molecular specificity and enhanced resolution of 3D structured illumination microscopy (SIM) to unlock structure-function relationships throughout an entire cell volume.  

Or, take advantage of the FIB-SEM as a stand-alone technology.  Specifically engineered by Janelia's researchers to obtain 3D images at a combined volume size and spatial resolution unattainable by commercial electron microscopes. Its ability to image whole cell ultrastructure at nanometer resolution is unparalleled in any other EM technique.

See detailed technical FIB-SEM specifications here.

See detailed technical CryoSIM specifications here.