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FIB-SEM

The Focused Ion Beam Scanning Electron Microscope (FIB-SEM):  Specifically engineered by Harald Hess' lab to obtain 3D images at a combined volume size, spatial resolution, and imaging speed previously unattainable by commercial electron microscopes. Its ability to image whole cell ultrastructure at nanometer resolution is unparalleled in any other EM technique.

 

See detailed technical specifications here