FIB-SEM/CryoSIM

Whole-Cell Electron Microscopy with Correlative Optical Super-Resolution

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Combine the nanoscale ultrastructure provided by focused ion beam scanning electron microscopy (FIB-SEM) with the molecular specificity and enhanced resolution of 3D structured illumination microscopy (SIM) to unlock structure-function relationships throughout an entire cell volume.  

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Or, take advantage of the FIB-SEM as a stand-alone technology.  Specifically engineered by Janelia's researchers to obtain 3D images at a combined volume size and spatial resolution unattainable by commercial electron microscopes. Its ability to image whole cell ultrastructure at nanometer resolution is unparalleled in any other EM technique.

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See detailed technical FIB-SEM specifications here.

See detailed technical CryoSIM specifications here.