Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) at the Advanced Imaging Center
Introduction Starting in August 2019, the Advanced Imaging Center (AIC) introduced its first pre-commercial electron microscope. This...
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) at the Advanced Imaging Center
Obtaining data from the AIC is not the same as using the data from the AIC
How poor photon budget can ruin your experiments and your AIC proposal
Multi-color single molecule localization microscopy
Navigating research compliance prior to your arrival
Probes for single molecule localization microscopy
Understanding Objective Orientation in the LLSM
Suitable Samples for Structured Illumination Microscopy
What makes a successful proposal to the AIC?
Lattice Light Sheet Sample Prep
Thoughts on fluorescence recovery analysis
Comparing Super-Resolution Techniques