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Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) at the Advanced Imaging Center

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) at the Advanced Imaging Center

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) at the Advanced Imaging Center

Introduction Starting in August 2019, the Advanced Imaging Center (AIC) introduced its first pre-commercial electron microscope. This...

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Aug 28, 20197 min read

How poor photon budget can ruin your experiments and your AIC proposal

How poor photon budget can ruin your experiments and your AIC proposal

How poor photon budget can ruin your experiments and your AIC proposal

Written by Teng-Leong Chew Photophysics of photobleaching A molecule will emit fluorescent light when its electron, falling from the...

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Jun 14, 20183 min read

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